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by Christophe Gorecki

Author: Christophe Gorecki
Subcategory: Engineering
Language: English
Publisher: Society of Photo Optical; New ed. edition (August 31, 2004)
Category: Engineering and Transport
Rating: 4.7
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PROCEEDINGS VOLUME 6995 Micro-technology plays an important role in everyday life, without being .

PROCEEDINGS VOLUME 6995. For the purchase of this volume in printed format, please visit Proceedings. Volume Number: 6995 Date Published: 2 June 2008. Micro-technology plays an important role in everyday life, without being much perceived. Cell phones, for instance, are daily equipped with small electronic components, which must have their quality level assured. New micro-metrology techniques were developed in the last years for such purposes.

Conference: Conference on Optical Micro- and Nanometrology V, Volume: 9132. Cite this publication.

Proceedings of spie by Christophe Gorecki, Anand K. Asundi, Wolfgang Osten, Proceedings of. .

Optical Micro- and Nanometrology in Microsystems Technology II. Christophe Gorecki Anand K. Asundi Wolfgang Osten. 8–10 April 2008 Strasbourg, France. by Christophe Gorecki, Anand K. Asundi, Wolfgang Osten, Proceedings of SPIE Vol. 6995 (SPIE, Bellingham, WA, 2008) Article CID Number. ISSN 0277-786X ISBN 9780819471932. Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the .

Start by marking Optical Micro- And Nanometrology in Manufacturing .

Start by marking Optical Micro- And Nanometrology in Manufacturing Technology: 29-30 April, 2004, Strasbourg, France as Want to Read: Want to Read savin. ant to Read. Published October 22nd 2004 by SPIE-International Society for Optical Engineering (first published April 2004). Optical Micro and Nanometrology in Microsystems Technology (Proceedings of SPIE). 0819453803 (ISBN13: 9780819453808).

SPIE - International Society For Optics and Photonics. At SPIE Photonics Europe. Series: Proceedings of SPIE Volume 6995. optical micro- and nanometrology in microsystems technology II. Item 43253. Title: Optical Micro- and Nanometrology in Microsystems Technology II. Desc: Proceedings of a meeting held 8-10 April 2008, Strasbourg, France.

Proceedings of SPIE are among the most cited references in patent literature. Format Paperback 277 pages. Dimensions 152 x 229mm. Publication date 30 Jul 2014. Publisher SPIE Press.

Proceedings of SPIE is the conference record of the Society of Photo-Optical Instrumentation Engineers (SPIE). The first proceedings were published in 1963. Proceedings of SPIE is indexed and abstracted in: Astrophysics Data System. International Aerospace Abstracts. Index to Scientific & Technical Proceedings.

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